Dr. Karl Y. Yee
at Jet Propulsion Lab
SPIE Involvement:
Publications (25)

Proceedings Article | 27 August 2022 Presentation + Paper
Proceedings Volume 12180, 121802O (2022) https://doi.org/10.1117/12.2629445
KEYWORDS: Diffraction, Data modeling, Polarization, Photomasks, Telescopes, Manufacturing, Etching, Optical instrument design, Finite-difference time-domain method, Error analysis

Proceedings Article | 1 September 2021 Presentation + Paper
Proceedings Volume 11823, 1182312 (2021) https://doi.org/10.1117/12.2595409
KEYWORDS: Data modeling, Diffraction, Manufacturing, Polarization, Exoplanets, Performance modeling, Optics manufacturing, Near field diffraction

SPIE Journal Paper | 8 January 2021 Open Access
JATIS, Vol. 7, Issue 02, 021207, (January 2021) https://doi.org/10.1117/12.10.1117/1.JATIS.7.2.021207
KEYWORDS: Diffraction, Photomasks, Data modeling, Apodization, Polarization, Geometrical optics, Manufacturing, Cameras, Optics manufacturing, Calibration

Proceedings Article | 13 December 2020 Presentation + Paper
Proceedings Volume 11443, 114431R (2020) https://doi.org/10.1117/12.2561048
KEYWORDS: Diffraction, Data modeling, Spectroscopy, Exoplanets, Space operations

SPIE Journal Paper | 24 September 2019
Thomas Pagano, Carlo Abesamis, Andres Andrade, Hartmut Aumann, Sarath Gunapala, Cate Heneghan, Robert Jarnot, Dean Johnson, Andy Lamborn, Yuki Maruyama, Sir Rafol, Nasrat Raouf, David Rider, Dave Ting, Dan Wilson, Karl Yee, Jerold Cole, Bill Good, Tom Kampe, Juancarlos Soto, Arn Adams, Matt Buckley, Richard Graham, Fred Nicol, Tony Vengel, John Moore, Thomas Coleman, Steve Schneider, Chris Esser, Scott Inlow, Devon Sanders, Karl Hansen, Matt Zeigler, Charles Dumont, Rebecca Walter, Joe Piacentine
JARS, Vol. 13, Issue 03, 032512, (September 2019) https://doi.org/10.1117/12.10.1117/1.JRS.13.032512
KEYWORDS: Infrared technology, Space operations, Infrared radiation, Spectroscopy, Staring arrays, Cryocoolers, Sensors, Cameras, Thermography, Zoom lenses

Showing 5 of 25 publications
Conference Committee Involvement (1)
Micro- and Nanotechnology Sensors, Systems, and Applications III
25 April 2011 | Orlando, Florida, United States
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