Dr. Karri Niemelä
CTO at Focalspec Oy
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 22 April 2019
Proc. SPIE. 10925, Photonic Instrumentation Engineering VI
KEYWORDS: Confocal microscopy, Metrology, 3D applications, Sensors, Glasses, Inspection, 3D metrology, 3D image processing

Proceedings Article | 2 February 2012
Proc. SPIE. 8295, Image Processing: Algorithms and Systems X; and Parallel Processing for Imaging Applications II
KEYWORDS: Detection and tracking algorithms, Imaging systems, Cameras, Inspection, Computing systems, 3D metrology, Reconstruction algorithms, Prototyping, Phase shifts, Structured light

Proceedings Article | 15 October 2005
Proc. SPIE. 5962, Optical Design and Engineering II
KEYWORDS: Microscopes, Telescopes, Optical design, Light emitting diodes, Cameras, Manufacturing, Image resolution, Image sensors, Mechanical engineering, Prototyping

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