Kathleen Brockdorf
at GE Sensing & Inspection Technologies Inc
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 16, 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: X-ray computed tomography, Sensors, X-rays, Copper, Bone, Computed tomography, Synchrotrons, Spatial resolution, Synchrotron radiation, Absorption

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