Dr. Katsuhiro Ishii
Professor at Graduate School for the Creation of New Photonics Industries
SPIE Involvement:
Author
Publications (24)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical amplifiers, Interferometers, Fourier transforms, Interferometry, Fiber lasers, Semiconductor lasers, Picosecond phenomena, Oscilloscopes, Pulsed laser operation

Proceedings Article | 28 July 2017
Proc. SPIE. 10414, Advances in Microscopic Imaging
KEYWORDS: Microscopes, Metrology, Imaging systems, Microscopy, 3D image processing

Proceedings Article | 22 February 2017
Proc. SPIE. 10089, Real-time Measurements, Rogue Phenomena, and Single-Shot Applications II
KEYWORDS: Reflectors, Mirrors, Fringe analysis, Doppler effect, Interferometers, Spectroscopy, Laser applications, Imaging spectroscopy, Laser irradiation, Picosecond phenomena, Velocity measurements, Pulsed laser operation

Proceedings Article | 6 August 2014
Proc. SPIE. 9232, International Conference on Optical Particle Characterization (OPC 2014)
KEYWORDS: Light sources, Scattering, Particles, Diffusion, Light scattering, Laser scattering, Transmission electron microscopy, Dynamic light scattering, Multiple scattering, Signal detection

Proceedings Article | 6 August 2014
Proc. SPIE. 9232, International Conference on Optical Particle Characterization (OPC 2014)
KEYWORDS: Sensors, Nanoparticles, Particles, Diffusion, Light scattering, Dynamic light scattering, Multiple scattering, Collimators, Signal detection, Particle sizing

Showing 5 of 24 publications
Conference Committee Involvement (1)
International Conference on Optical Particle Characterization (OPC 2014)
10 March 2014 | Tokyo, Japan
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