Dr. Kay Gastinger
Division Director at Norwegian Univ of Science and Technology
SPIE Involvement:
Publications (16)

Proceedings Article | 3 November 2011 Paper
Proceedings Volume 8011, 80117O (2011) https://doi.org/10.1117/12.903256
KEYWORDS: Semiconducting wafers, Interferometers, Inspection, Diffractive optical elements, Wafer-level optics, Imaging systems, Interferometry, Lithium, Microelectromechanical systems, Micro optics

Proceedings Article | 27 May 2011 Paper
Kay Gastinger, Lars Johnsen, Ove Simonsen, Astrid Aksnes
Proceedings Volume 8082, 80820U (2011) https://doi.org/10.1117/12.889498
KEYWORDS: Silicon, Spatial resolution, Silicon carbide, Solids, Interferometry, Interferometers, Semiconducting wafers, Near infrared, Image resolution, Inspection

Proceedings Article | 14 September 2010 Paper
Kay Gastinger, Lars Johnsen
Proceedings Volume 7387, 738713 (2010) https://doi.org/10.1117/12.871609
KEYWORDS: Silicon, Spatial resolution, Imaging systems, Surface finishing, Near infrared, Speckle, Silicon carbide, Optical coherence tomography, Interferometers, Semiconducting wafers

Proceedings Article | 14 September 2010 Paper
Proceedings Volume 7387, 73870M (2010) https://doi.org/10.1117/12.871522
KEYWORDS: Cameras, Demodulation, Interferometers, Interferometry, Imaging systems, Inspection, Signal detection, Signal processing, Data processing, Modulation

Proceedings Article | 2 August 2010 Paper
Proceedings Volume 7791, 779103 (2010) https://doi.org/10.1117/12.862170
KEYWORDS: Interferometers, Semiconducting wafers, Cameras, Lithium, Imaging systems, Inspection, Diffraction gratings, Demodulation, Signal processing, Wafer-level optics

Showing 5 of 16 publications
Proceedings Volume Editor (2)

SPIE Conference Volume | 26 May 2011

SPIE Conference Volume | 27 May 2003

Conference Committee Involvement (9)
Interferometry XVI: Applications
14 August 2012 | San Diego, California, United States
Optical Micro- and Nanometrology
16 April 2012 | Brussels, Belgium
Optical Measurement Systems for Industrial Inspection
23 May 2011 | Munich, Germany
Interferometry XV: Applications
3 August 2010 | San Diego, California, United States
Optical Micro- and Nanometrology
13 April 2010 | Brussels, Belgium
Showing 5 of 9 Conference Committees
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