Dr. Kayori Takahashi
at AIST
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

PROCEEDINGS ARTICLE | August 6, 2014
Proc. SPIE. 9232, International Conference on Optical Particle Characterization (OPC 2014)
KEYWORDS: Metrology, Scattering, Nanoparticles, Particles, Diffusion, Atomic force microscopy, Scanning electron microscopy, Dynamic light scattering, Nanomaterials, Standards development

Conference Committee Involvement (1)
International Conference on Optical Particle Characterization (OPC 2014)
10 March 2014 | Tokyo, Japan
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