Prof. Kazuhiko Oka Profile

Prof. Kazuhiko Oka

Professor at Hirosaki Univ

SPIE Involvement:

Scholarship Committee | Symposia Committee | Fellow status | Conference Program Committee | Author

Publications (34)

PROCEEDINGS ARTICLE | February 22, 2018

Generation of arbitrary axisymmetrically polarized pulses with a broadband spectrum

Proc. SPIE. 10549, Complex Light and Optical Forces XII

KEYWORDS: Fringe analysis, Elliptical polarization, Modulation, Polarization, Interferometers, Dispersion, Wave plates, Spatial light modulators, Amplitude modulation

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PROCEEDINGS ARTICLE | September 7, 2017

Hyperspectroscopic Mueller-matrix polarimeter based on channeled polarimetry

Proc. SPIE. 10407, Polarization Science and Remote Sensing VIII

KEYWORDS: Hyperspectral imaging, Statistical analysis, Modulation, Polarization, Imaging systems, Spectroscopy, Imaging spectroscopy, Polarimetry, Hyperspectral systems, Light

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PROCEEDINGS ARTICLE | April 18, 2017

Generation of intense ultrafast-rotating ring-shaped optical lattices with programmable control of rotational symmetry

Proc. SPIE. 10252, Optical Manipulation Conference

KEYWORDS: Ultrafast phenomena, Optical amplifiers, Optical testing, Computer generated holography, Spatial light modulators, Optical vortices, Terahertz radiation, Sapphire lasers, Picosecond phenomena, Optical damage

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PROCEEDINGS ARTICLE | September 1, 2015

Snapshot Mueller-matrix spectropolarimeter using spectral and spatial carriers

Proc. SPIE. 9613, Polarization Science and Remote Sensing VII

KEYWORDS: Mueller matrices, Statistical analysis, Modulation, Polarization, Spectroscopy, Polarizers, Wave plates, Polarimetry, Spectral resolution, Charge-coupled devices

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PROCEEDINGS ARTICLE | August 28, 2014

Recent progress on phase-mask coronagraphy based on photonic-crystal technology

Proc. SPIE. 9143, Space Telescopes and Instrumentation 2014: Optical, Infrared, and Millimeter Wave

KEYWORDS: Telescopes, Light sources, Polarization, Manufacturing, Polarizers, Adaptive optics, Coronagraphy, Space telescopes, Photomasks, Spiral phase plates

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PROCEEDINGS ARTICLE | October 22, 2013

Snapshot imaging Mueller matrix instrument

Proc. SPIE. 8897, Electro-Optical Remote Sensing, Photonic Technologies, and Applications VII; and Military Applications in Hyperspectral Imaging and High Spatial Resolution Sensing

KEYWORDS: Staring arrays, Prisms, Statistical analysis, Modulation, Polarization, Interferometers, Calibration, Remote sensing, Wave plates, Polarimetry

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PROCEEDINGS ARTICLE | September 27, 2013

Wide field snapshot imaging polarimeter using modified Savart plates

Proc. SPIE. 8873, Polarization Science and Remote Sensing VI

KEYWORDS: Optical design, Surface plasmons, Polarization, Imaging systems, Calibration, Crystals, Polarimetry, Distortion, Geometrical optics, Prototyping

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PROCEEDINGS ARTICLE | September 27, 2013

Spectroscopic full polarimeters using spatial carriers

Proc. SPIE. 8873, Polarization Science and Remote Sensing VI

KEYWORDS: Optical filters, Prisms, Modulation, Polarization, Spectroscopy, Polarizers, Polarimetry, Optical testing, Spectral resolution, Charge-coupled devices

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PROCEEDINGS ARTICLE | September 21, 2012

Coronagraph focal-plane phase masks based on photonic crystal technology: recent progress and observational strategy

Proc. SPIE. 8442, Space Telescopes and Instrumentation 2012: Optical, Infrared, and Millimeter Wave

KEYWORDS: Stars, Polarization, Manufacturing, Photonic crystals, Phase shift keying, Polarimetry, Coronagraphy, Photomasks, Planets, Spiral phase plates

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PROCEEDINGS ARTICLE | September 13, 2012

Wavelength-scanning polarimetric interferometry using channeled spectroscopic polarization state generator

Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis

KEYWORDS: Modulation, Polarization, Interferometers, Calibration, Spectroscopy, Interferometry, Wave plates, Polarimetry, CCD cameras, Phase measurement

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PROCEEDINGS ARTICLE | February 11, 2012

Diffraction characteristics of optical and polarization vortices generated by an axially symmetric polarizer

Proc. SPIE. 8274, Complex Light and Optical Forces VI

KEYWORDS: Superposition, Diffraction, Polarization, Numerical simulations, Polarizers, Optical vortices, Collimation, Near field diffraction, Optical simulations, Spiral phase plates

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PROCEEDINGS ARTICLE | September 30, 2011

Development of white light polarization lidar system

Proc. SPIE. 8182, Lidar Technologies, Techniques, and Measurements for Atmospheric Remote Sensing VII

KEYWORDS: Atmospheric laser remote sensing, Polarization, Backscatter, LIDAR, Aerosols, Copper, Wave plates, Clouds, Krypton, Atmospheric particles

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PROCEEDINGS ARTICLE | September 15, 2011

Taking the vector vortex coronagraph to the next level for ground- and space-based exoplanet imaging instruments: review of technology developments in the USA, Japan, and Europe

Proc. SPIE. 8151, Techniques and Instrumentation for Detection of Exoplanets V

KEYWORDS: Telescopes, Polarization, Polymers, Photonic crystals, Coronagraphy, Exoplanets, Space telescopes, Liquid crystals, Spiral phase plates, Optics manufacturing

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PROCEEDINGS ARTICLE | September 10, 2011

Channeled spectropolarimeter using a wavelength-scanning laser and a channeled spectroscopic polarization state generator

Proc. SPIE. 8160, Polarization Science and Remote Sensing V

KEYWORDS: Light sources, Statistical analysis, Modulation, Polarization, Spectroscopy, Polarizers, Wave plates, Polarimetry, Semiconductor lasers, CCD cameras

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PROCEEDINGS ARTICLE | September 10, 2011

Spectrally broadband channeled imaging polarimeter using polarization gratings

Proc. SPIE. 8160, Polarization Science and Remote Sensing V

KEYWORDS: Staring arrays, Image fusion, Diffraction, Linear polarizers, Modulation, Polarization, Calibration, Polarimetry, Objectives, Liquid crystals

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PROCEEDINGS ARTICLE | September 19, 2007

Channeled spectroscopic polarization state generator (CSPSG) and its application to spectroscopic measurement of Mueller matrix

Proc. SPIE. 6682, Polarization Science and Remote Sensing III

KEYWORDS: Light sources, Statistical analysis, Polarization, Calibration, Spectroscopy, Wavefronts, Polarizers, Wave plates, Polarimetry, Polysomnography

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PROCEEDINGS ARTICLE | September 8, 2006

Snapshot complete imaging polarimeter using Savart plates

Proc. SPIE. 6295, Infrared Detectors and Focal Plane Arrays VIII

KEYWORDS: Surface plasmons, Polarization, Lenses, Cameras, Electrodes, Video, Polarimetry, Image analysis, Liquid crystals, Polarization control

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PROCEEDINGS ARTICLE | August 31, 2005

New configuration of channeled spectropolarimeter for snapshot polarimetric measurement of materials

Proc. SPIE. 5878, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies II

KEYWORDS: Light sources, Statistical analysis, Calibration, Spectroscopy, Silicon, Polarizers, Wave plates, Polarimetry, Head, Prototyping

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PROCEEDINGS ARTICLE | August 18, 2005

Stabilized channeled spectropolarimeter using integrated calcite prisms

Proc. SPIE. 5888, Polarization Science and Remote Sensing II

KEYWORDS: Prisms, Polarization, Calibration, Spectroscopy, Wave plates, Optical testing, Signal processing, Integrated optics, Calcite, Prototyping

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PROCEEDINGS ARTICLE | September 20, 2002

Singleshot spectroscopic polarimetry using channeled spectrum

Proc. SPIE. 4919, Advanced Materials and Devices for Sensing and Imaging

KEYWORDS: Thin films, Modulation, Polarization, Spectroscopy, Remote sensing, Lamps, Interferometry, Imaging spectroscopy, Wave plates, Polarimetry

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PROCEEDINGS ARTICLE | January 17, 2002

Static Fourier-transform spectrometer based on Savart polariscope

Proc. SPIE. 4480, Imaging Spectrometry VII

KEYWORDS: Mirrors, Beam splitters, Sagnac interferometers, Imaging systems, Interferometers, Sensors, Spectroscopy, Fourier transforms, Polarizers, Charge-coupled devices

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PROCEEDINGS ARTICLE | January 9, 2002

Static spectroscopic ellipsometer based on optical frequency-domain interferometry

Proc. SPIE. 4481, Polarization Analysis and Measurement IV

KEYWORDS: Thin films, Spectrum analysis, Statistical analysis, Modulation, Polarization, Spectroscopy, Silicon, Interferometry, Wave plates, Spectroscopic ellipsometry

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PROCEEDINGS ARTICLE | May 8, 2001

Novel Fourier transform imaging spectrometer

Proc. SPIE. 4416, Optical Engineering for Sensing and Nanotechnology (ICOSN 2001)

KEYWORDS: Nanotechnology, Lithium, Optical sensing, Spectroscopy, Fourier transforms, Optical engineering

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PROCEEDINGS ARTICLE | July 19, 1999

Spectroscopic polarimeter based on optical frequency-domain interferometry

Proc. SPIE. 3749, 18th Congress of the International Commission for Optics

KEYWORDS: Polarization, Birefringence, Quartz, Spectroscopy, Interferometry, Wave plates, Polarimetry, Optical testing, Terahertz radiation, Spectroscopes

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PROCEEDINGS ARTICLE | September 1, 1996

Spatial coherence control for illumination by use of liquid-crystal spatial phase-modulator

Proc. SPIE. 2778, 17th Congress of the International Commission for Optics: Optics for Science and New Technology

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PROCEEDINGS ARTICLE | August 16, 1996

Optical heterodyne polarimeter with spatiotemporal carrier frequencies for studying dynamic photoelastic stresses

Proc. SPIE. 2873, International Symposium on Polarization Analysis and Applications to Device Technology

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An optical heterodyne polarimeter operating with spatiotemporal carrier frequencies is presented for contour mapping of dynamic principal stress distributions in an epoxy photoelastic sample. Introducing of the spatiotemporad carrier frequencies causes the temporal and spatial resolutions to be fairly improved in the mapping of the stress distributions. The major functional scheme of the polarimeter is illustrated in Fig. 1. A circularly polarized beam of light transmitted by the loaded photoelastic sample turns into an elliptically polarized signal beam, which is photomixed with a local oscillator beam consisting of orthogonal linearly polarized two-frequency components. At every pixel of the arrayed photodetector, the elliptically polarized signal beam is decomposed into orthogonal linearly polarized components to be interfered, respectively, with the counterpart v1 and UT components of the local oscillator beam. Since both the z' and z'2' components are tilted in wavefront at different angles to the signal beam, the resultant photourrentgenerated at every pixel involves two beat-components at different spatiotemporal carrier frequencies. The two beat-components can be filtered in the spatiotemporal frequency domain to irovicle significant information for mapping the principal stress distribution. The combination of the spatial and temporal carrier frequencies is capable of broadening the bandwidths in the spatial and temporal frequency domain compared with.those using only the spatial or temporal carrier frequencies [1]. The spatial and temporal bandwidths of the present polarimeter are found to be both approximately three times as wide as those of the previously reported optical heterodyne polarimeters [2,3]. Experimental demonstration was carried out using a Mach-Zehnder type optical heterodyne interferometer. The temporal and spatial bandwidths of the MOS type arrayed photodetector were set at 1033 Hz and 10 mm1 ,respectively, and.the temporal and spatial bandwidths for filtering were set at 500 Hz and 5 mm1, respectively. Under these conditions, the temporal and spatial bandwidths were 1 ms and 0.1 mm for mapping of the stress distributions. A sample plate of epoxy with a circular hole of 1.5 mm in diameter was used for the experiment. The top and bottom ends of the plate were supported, and an increasing force was applied from the left to the hole. The contour mapped resuits of the spatiotemporal stress distributions ar shown in Fig. 2. The first trace is the azimuth x ofthe principal stress a, and the second and third traces are the magnitudes of the orthogonal principal stresses o and a, respectively. The spacing of two successive contours of the azimuth is 15°, and that of the magnitudes is 2.0 x iO N/rn2. The tensile and compressive stresses are indicated, respectively, by positive and negative signs. As can be seen froth the figure, o. is tensile at the left of the hole, whereas 0qiscompressive at the right of the hole. The gradients of the principal stresses increase with time.

PROCEEDINGS ARTICLE | August 16, 1996

Retardation measurements of light scattered by metallic rough surfaces

Proc. SPIE. 2873, International Symposium on Polarization Analysis and Applications to Device Technology

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PROCEEDINGS ARTICLE | September 14, 1994

Spatiotemporal strain distribution mapping using novel optical heterodyne polarimeter

Proc. SPIE. 2265, Polarization Analysis and Measurement II

KEYWORDS: Photodetectors, Beam splitters, Oscillators, Photoelasticity, Polarization, Cameras, Polarimetry, Temporal resolution, Heterodyning, Photoelastic analysis

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PROCEEDINGS ARTICLE | July 23, 1993

Spatiotemporal birefringence measurements in an anti-ferroelectric liquid crystal cell by polarization interferometry

Proc. SPIE. 1983, 16th Congress of the International Commission for Optics: Optics as a Key to High Technology

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PROCEEDINGS ARTICLE | December 11, 1992

Polarimeter for mapping spatial distribution of dynamic state of polarization

Proc. SPIE. 1746, Polarization Analysis and Measurement

KEYWORDS: Mirrors, Beam splitters, Photoelasticity, Polarization, Cameras, Video, Fourier transforms, Polarimetry, Molybdenum, Polarization analysis

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PROCEEDINGS ARTICLE | October 20, 1992

Contour mapping of dynamic stress distributions by novel polarization interferometry

Proc. SPIE. 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation

KEYWORDS: Optical components, Beam splitters, Photoelasticity, Polarization, Cameras, Interferometry, Polarizers, Polarimetry, Photoelastic analysis, Molybdenum

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