Prof. Kazunori Umeda
Associate Professor at Chuo Univ
SPIE Involvement:
Author | Editor
Publications (5)

Proceedings Article | 16 July 2019
Proc. SPIE. 11172, Fourteenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Switching, Imaging systems, Cameras, Image processing, Fourier transforms, Image resolution, 3D metrology, Space operations, Gesture recognition, 3D image processing

Proceedings Article | 16 July 2019
Proc. SPIE. 11172, Fourteenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Cameras, Calibration, Image processing, 3D modeling, Particle filters, 3D image processing, OpenGL

Proceedings Article | 14 May 2017
Proc. SPIE. 10338, Thirteenth International Conference on Quality Control by Artificial Vision 2017
KEYWORDS: Imaging systems, Cameras, Calibration, Error analysis, Distortion, Computer simulations, 3D modeling, Content addressable memory, Device simulation, 3D image processing

Proceedings Article | 19 January 2009
Proc. SPIE. 7239, Three-Dimensional Imaging Metrology
KEYWORDS: 3D acquisition, Detection and tracking algorithms, Imaging systems, Cameras, Error analysis, Surveillance, Stereoscopic cameras, Distance measurement, 3D metrology, 3D image processing

Proceedings Article | 6 December 2005
Proc. SPIE. 6051, Optomechatronic Machine Vision
KEYWORDS: Visible radiation, Reflection, Cameras, Reflectivity, Digital cameras, Bidirectional reflectance transmission function, Digital imaging, Distance measurement, 3D metrology, Charge-coupled devices

Proceedings Volume Editor (1)

Conference Committee Involvement (1)
The International Conference on Quality Control by Artificial Vision 2017
14 May 2017 | Tokyo, Japan
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