Prof. Kazushi Yamanaka
Professor at Tohoku Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

Proceedings Article | 22 July 2003
Proc. SPIE. 5045, Testing, Reliability, and Application of Micro- and Nano-Material Systems
KEYWORDS: Nanotechnology, Crystals, Silicon, Reliability, Nondestructive evaluation, Atomic force microscopy, Ultrasonics, Vibrometry, Solids, Finite element methods

Proceedings Article | 7 June 2002
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Lithium, Remote sensing, Reliability, Image resolution, Nondestructive evaluation, Atomic force microscopy, Ultrasonics, Nanomaterials

Proceedings Article | 7 June 2002
Proc. SPIE. 4703, Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems
KEYWORDS: Diffraction, Mechanics, Calibration, Ultrasonography, Inspection, Nondestructive evaluation, Ultrasonics, Scanning electron microscopy, Transducers, Aluminum

Conference Committee Involvement (6)
Nano-, Bio-, and Info-Tech Sensors and Systems
9 March 2009 | San Diego, California, United States
Nanosensors and Microsensors for Bio-Systems
11 March 2008 | San Diego, California, United States
Nano-, Micro- and Bio-Sensors and Systems
21 March 2007 | San Diego, California, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems IV
1 March 2006 | San Diego, CA, United States
Testing, Reliability, and Application of Micro- and Nano-Material Systems III
9 March 2005 | San Diego, CA, United States
Showing 5 of 6 Conference Committees
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