Prof. Kazuto Yamauchi
Professor at Osaka Univ
SPIE Involvement:
Conference Program Committee | Author | Editor
Publications (48)

Proceedings Article | 9 September 2019
Proc. SPIE. 11112, X-Ray Nanoimaging: Instruments and Methods IV
KEYWORDS: Microscopes, Mirrors, X-ray optics, Stars, Cameras, X-rays, Objectives, Spatial resolution

Proceedings Article | 9 September 2019
Proc. SPIE. 11108, Advances in X-Ray/EUV Optics and Components XIV
KEYWORDS: Mirrors, X-ray optics, X-rays, Control systems, Deformable mirrors, Beam shaping, X-ray lasers, Synchrotron radiation, Free electron lasers, Beam controllers

Proceedings Article | 9 September 2019
Proc. SPIE. 11108, Advances in X-Ray/EUV Optics and Components XIV
KEYWORDS: Mirrors, Interferometers, X-rays, Laser development, Nanoprobes, Speckle pattern, Beam shaping, X-ray lasers, Free electron lasers, Diffraction gratings

Proceedings Article | 9 September 2019
Proc. SPIE. 11109, Advances in Metrology for X-Ray and EUV Optics VIII
KEYWORDS: Thin films, X-ray optics, Interferometers, Wavefront sensors, Optical fabrication, Optical testing, Nonlinear optics, Spatial coherence, Optical alignment, X-ray fluorescence spectroscopy

Proceedings Article | 18 September 2018
Proc. SPIE. 10760, Advances in X-Ray/EUV Optics and Components XIII
KEYWORDS: Point spread functions, Mirrors, X-ray optics, Polishing, Sun, Scattering, X-rays, Coronagraphy, Solar processes, Plasma

Showing 5 of 48 publications
Proceedings Volume Editor (5)

SPIE Conference Volume | 11 January 2017

SPIE Conference Volume | 14 October 2014

SPIE Conference Volume | 26 September 2012

SPIE Conference Volume | 23 August 2010

Conference Committee Involvement (35)
Advances in X-Ray/EUV Optics and Components XV
26 August 2020 | Online Only, California, United States
Optical Manufacturing and Testing XIII
25 August 2020 | Online Only, California, United States
Advances in Metrology for X-Ray and EUV Optics IX
24 August 2020 | Online Only, California, United States
Advances in X-Ray/EUV Optics and Components XIV
14 August 2019 | San Diego, California, United States
Advances in Metrology for X-Ray and EUV Optics VIII
11 August 2019 | San Diego, California, United States
Showing 5 of 35 Conference Committees
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