Mr. Ke Chen
at Univ of Wollongong
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | November 20, 2012
Proc. SPIE. 8563, Optical Metrology and Inspection for Industrial Applications II
KEYWORDS: Fringe analysis, 3D acquisition, Detection and tracking algorithms, Composites, Fourier transforms, Phase shift keying, CCD cameras, 3D metrology, Projection systems, Reconstruction algorithms

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