Ke Lin
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SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | November 13, 2014
Proc. SPIE. 9276, Optical Metrology and Inspection for Industrial Applications III
KEYWORDS: Optical signal processing, Modulation, Copper, Interferometry, Optical testing, Semiconductor lasers, Signal processing, Oscilloscopes, Computer engineering, Systems modeling

PROCEEDINGS ARTICLE | March 7, 2014
Proc. SPIE. 8975, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
KEYWORDS: Target detection, Modulation, Photodiodes, Semiconductor lasers, Data processing, Signal processing, Microlens, Beam shaping, Reconstruction algorithms, Signal detection

PROCEEDINGS ARTICLE | March 7, 2014
Proc. SPIE. 8975, Reliability, Packaging, Testing, and Characterization of MOEMS/MEMS, Nanodevices, and Nanomaterials XIII
KEYWORDS: Signal to noise ratio, Modulation, Error analysis, Interference (communication), Semiconductor lasers, Data processing, Signal generators, Stereolithography, Feedback signals, Laser sintering

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