Ke Liu
at Fujitsu Research and Development Center Co Ltd
SPIE Involvement:
Publications (4)

Proceedings Article | 28 January 2009
Proc. SPIE. 7156, 2008 International Conference on Optical Instruments and Technology: Optical Systems and Optoelectronic Instruments
KEYWORDS: Diffraction, Point diffraction interferometers, Spatial filters, Wavefronts, Optical testing, Charge-coupled devices, Geometrical optics, Beam propagation method, Phase shifts, Diffraction gratings

Proceedings Article | 31 December 2008
Proc. SPIE. 7130, Fourth International Symposium on Precision Mechanical Measurements
KEYWORDS: Monochromatic aberrations, Mirrors, Optical design, Interferometers, Projection systems, Extreme ultraviolet lithography, Optical alignment, Modulation transfer functions, Tolerancing, Code v

Proceedings Article | 5 March 2008
Proc. SPIE. 6623, International Symposium on Photoelectronic Detection and Imaging 2007: Image Processing
KEYWORDS: Anisotropic filtering, Image processing, Denoising, Diffusion, Linear filtering, Gaussian filters, Partial differential equations, Image filtering, Palladium, Anisotropic diffusion

Proceedings Article | 27 November 2007
Proc. SPIE. 6723, 3rd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Detection and tracking algorithms, Argon, Image processing, Fourier transforms, Chromium, Computer simulations, Optical testing, Data processing, Spatial resolution, Phase shifts

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