Ke Ma
Student at Sichuan Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 27 May 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: 3D metrology, Fringe analysis, 3D image processing, Fourier transforms, Projection systems, 3D image reconstruction, Cameras, Phase measurement, RGB color model, Digital imaging

Proceedings Article | 3 August 2010
Proc. SPIE. 7790, Interferometry XV: Techniques and Analysis
KEYWORDS: Fringe analysis, Image processing, 3D image processing, Projection systems, Cameras, Phase shift keying, 3D metrology, Calibration, Digital image processing, Structured light

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