Prof. Ke Xu
at Univ of Science and Technology Beijing
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | November 15, 2012
OE Vol. 51 Issue 11
KEYWORDS: Feature extraction, Aluminum, Metals, Image classification, Databases, Inspection, Computed tomography, Wavelet transforms, Dimension reduction, Detection and tracking algorithms

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8417, 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Defect detection, Cameras, Image segmentation, Photography, Inspection, CCD cameras, Detector development, Machine vision, 3D vision, 3D image processing

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