Ms. Ke Xu
at 4020 El Camino Real Apt 2201
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 13, 2012
Proc. SPIE. 8493, Interferometry XVI: Techniques and Analysis
KEYWORDS: GRIN lenses, Refractive index, Metrology, Optical coherence tomography, Polymers, Interfaces, Nondestructive evaluation, 3D metrology, Signal detection, 3D image processing

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