Prof. Kees J. Weijer
at Univ of Dundee
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 25 August 2017
Proc. SPIE. 10347, Optical Trapping and Optical Micromanipulation XIV
KEYWORDS: Statistical analysis, Scattering, Microscopy, Light scattering, Laser scattering, Quantitative analysis, Biology, Image quality, Bessel beams, Beam shaping

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