Keisuke Goto
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 28 April 2020
JEI Vol. 29 Issue 04
KEYWORDS: Inspection, X-rays, X-ray imaging, X-ray computed tomography, Feature extraction, Statistical modeling, Binary data, Neural networks, Error analysis, Defect detection

Proceedings Article | 16 July 2019 Paper
Proc. SPIE. 11172, Fourteenth International Conference on Quality Control by Artificial Vision
KEYWORDS: Statistical analysis, X-ray computed tomography, Defect detection, Error analysis, X-rays, Inspection, Computer programming, Feature extraction, Neural networks, X-ray imaging

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top