Keith Healy
at Leidos Inc
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Wavefront sensors, Wavefronts, Imaging systems, Sensors, Cameras, 3D image reconstruction, Off axis mirrors, Mirrors, Analytical research, Metrology

Proceedings Article | 3 September 2019
Proc. SPIE. 11102, Applied Optical Metrology III
KEYWORDS: Interfaces, Atmospheric optics, Mirrors, Imaging systems, Wind measurement, Analytical research, Directed energy weapons, Visualization, Optical design, Atmospheric sciences

Proceedings Article | 23 April 2019
Proc. SPIE. 11030, Holography: Advances and Modern Trends VI
KEYWORDS: Wavefronts, Sensors, Wavefront sensors, 3D image reconstruction, Digital holography, Cameras, Beam splitters, Mirrors, Imaging systems, Turbulence

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