Dr. Kemao Qian
Associate Professor at Nanyang Technological Univ
SPIE Involvement:
Conference Chair | Conference Program Committee | Author | Editor
Publications (38)

Proceedings Article | 18 June 2024 Presentation
Proceedings Volume 12997, 1299704 (2024) https://doi.org/10.1117/12.3024174
KEYWORDS: Fringe analysis

Proceedings Article | 15 February 2024 Paper
Proceedings Volume 13069, 1306919 (2024) https://doi.org/10.1117/12.3023396
KEYWORDS: Agriculture, Inspection, X-rays, X-ray imaging, X-ray sources, Neural networks, Sensors, Education and training, Transformers, X-ray detectors

SPIE Journal Paper | 3 August 2022 Open Access
APN, Vol. 1, Issue 01, 014001, (August 2022) https://doi.org/10.1117/12.10.1117/1.APN.1.1.014001
KEYWORDS: Neural networks, Signal to noise ratio, Photonics, Superposition, Denoising, Zernike polynomials, Matrices, Computer simulations, Interferometric synthetic aperture radar, Magnetic resonance imaging

SPIE Journal Paper | 22 October 2018
Qian Kemao, Nimisha Agarwal, Shien Ri, Qinghua Wang
OE, Vol. 57, Issue 10, 100503, (October 2018) https://doi.org/10.1117/12.10.1117/1.OE.57.10.100503
KEYWORDS: Fringe analysis, Demodulation, Detection and tracking algorithms, Algorithms, Fourier transforms, Picosecond phenomena, Phase shifts, Error analysis, Optical engineering, Algorithm development

SPIE Journal Paper | 24 August 2017
Nimisha Agarwal, Qian Kemao
OE, Vol. 56, Issue 08, 080501, (August 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.8.080501
KEYWORDS: Phase shifts, Fringe analysis, Error analysis, Fourier transforms, Algorithm development, Optical engineering, Computer science, Computer engineering, Phase retrieval, Denoising

Showing 5 of 38 publications
Proceedings Volume Editor (13)

Showing 5 of 13 publications
Conference Committee Involvement (40)
Dimensional Optical Metrology and Inspection for Practical Applications XIV
13 April 2025 | Orlando, Florida, United States
Optical Metrology and Inspection for Industrial Applications XI
12 October 2024 | Nantong, Jiangsu, China
Dimensional Optical Metrology and Inspection for Practical Applications XIII
24 April 2024 | National Harbor, Maryland, United States
Optical Technology and Measurement for Industrial Applications Conference
22 April 2024 | Yokohama, Japan
International Workshop on Advanced Imaging Technology (IWAIT) 2024
7 January 2024 | Langkawi, Malaysia
Showing 5 of 40 Conference Committees
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