Dr. Ken Goto
at Tamura Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 March 2020 Paper
Proc. SPIE. 11281, Oxide-based Materials and Devices XI
KEYWORDS: Reliability

Proceedings Article | 23 February 2018 Paper
Proc. SPIE. 10533, Oxide-based Materials and Devices IX
KEYWORDS: Gallium, Field effect transistors, Transistors, Diodes, Silicon, Gamma radiation, Electronic components, Oxides, Silicon carbide, Gallium nitride

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