Dr. Ken K. Ho Profile

Dr. Ken K. Ho

President at Fortis Technologies Inc

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Author

Publications (8)

Proceedings Article | 27 April 2007 Paper

Microscale damping using thin film active materials

Catherine Kerrigan, Ken Ho, K. Mohanchandra, Gregory Carman

Proceedings Volume 6525, 65250V (2007) https://doi.org/10.1117/12.716592

KEYWORDS: Thin films, Silicon, Silicon films, Absorption, Nickel, Microelectromechanical systems, Terbium, Shape memory alloys, Dysprosium, Semiconducting wafers

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Proceedings Article | 27 April 2007 Paper

Passive vibration damping with magnetostrictive composite material

Joseph Maly, Gregory Carmen, James Goodding, Catherine Kerrigan, Ken Ho

Proceedings Volume 6525, 652515 (2007) https://doi.org/10.1117/12.717873

KEYWORDS: Terbium, Magnetism, Composites, Particles, Manufacturing, Finite element methods, Temperature metrology, Crystals, Dysprosium, Iron

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Proceedings Article | 17 March 2006 Paper

Passive damping of thin film Nitinol

Catherine Kerrigan, K. Mohachandra, Gregory Carman

Proceedings Volume 6169, 61690M (2006) https://doi.org/10.1117/12.658824

KEYWORDS: Thin films, Silicon, Microelectromechanical systems, Shape memory alloys, Semiconducting wafers, Multilayers, Absorption, Silicon films, Temperature metrology, Nickel

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Proceedings Article | 5 May 2005 Paper

Stoichiometric study of TbxDy(1-x)Fe2 particulate composites for passive damping

Ken Ho, Catherine Kerrigan, Omar Luna, Gregory Carman

Proceedings Volume 5762, (2005) https://doi.org/10.1117/12.607298

KEYWORDS: Composites, Terbium, Magnetism, Magnetostrictive materials, Dysprosium, Iron, Particles, Epoxies, Anisotropy, Crystals

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Proceedings Article | 11 July 2002 Paper

Influence of target temperature on sputter deposited Ti-Ni-Cu and Ti-Ni-Pd shape memory alloys

Kotekar Mohanchandra, Ken Ho, Gregory Carman

Proceedings Volume 4699, (2002) https://doi.org/10.1117/12.474978

KEYWORDS: Crystals, Temperature metrology, Sputter deposition, Shape memory alloys, Transmission electron microscopy, Thin films, X-ray diffraction, Copper, Crystallography, Annealing

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Proceedings Article | 11 July 2001 Paper

Influence of target temperature on crystallization and properties of NiTi thin film shape memory alloy

Kotekar Mohanchandra, Ken Ho, Gregory Carman

Proceedings Volume 4333, (2001) https://doi.org/10.1117/12.432783

KEYWORDS: Sputter deposition, Crystals, Temperature metrology, Thin films, Titanium, X-ray diffraction, X-rays, Transmission electron microscopy, Atrial fibrillation, Shape memory alloys

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Proceedings Article | 12 July 1999 Paper

Sputter deposition of NiTi thin film exhibiting the SME at room temperatures

Ken Ho, Gregory Carman, Peter Jardine

Proceedings Volume 3675, (1999) https://doi.org/10.1117/12.352803

KEYWORDS: Sputter deposition, Titanium, Thin films, Actuators, Microelectromechanical systems, Control systems, Thin film deposition, Heat treatments, Shape memory alloys, Crystals

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Proceedings Article | 14 February 1997 Paper

Modeling and measuring the response times of thin film TiNi

Ken Ho, Peter Jardine, Gregory Carman, Chang-Jin Kim

Proceedings Volume 3040, (1997) https://doi.org/10.1117/12.267109

KEYWORDS: Thin films, Convection, Data modeling, Actuators, Temperature metrology, Silicon films, Performance modeling, Silicon, Analytical research, Microelectromechanical systems

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Showing 5 of 8 publications

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