Dr. Ken K. Ho
President at Fortis Technologies Inc
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | April 27, 2007
Proc. SPIE. 6525, Active and Passive Smart Structures and Integrated Systems 2007
KEYWORDS: Iron, Particles, Crystals, Composites, Manufacturing, Magnetism, Finite element methods, Dysprosium, Terbium, Temperature metrology

PROCEEDINGS ARTICLE | April 27, 2007
Proc. SPIE. 6525, Active and Passive Smart Structures and Integrated Systems 2007
KEYWORDS: Microelectromechanical systems, Thin films, Nickel, Silicon, Silicon films, Dysprosium, Terbium, Semiconducting wafers, Shape memory alloys, Absorption

PROCEEDINGS ARTICLE | March 17, 2006
Proc. SPIE. 6169, Smart Structures and Materials 2006: Damping and Isolation
KEYWORDS: Microelectromechanical systems, Thin films, Multilayers, Nickel, Silicon, Silicon films, Semiconducting wafers, Shape memory alloys, Temperature metrology, Absorption

PROCEEDINGS ARTICLE | May 5, 2005
Proc. SPIE. 5762, Smart Structures and Materials 2005: Industrial and Commercial Applications of Smart Structures Technologies
KEYWORDS: Iron, Particles, Crystals, Composites, Magnetism, Dysprosium, Terbium, Epoxies, Magnetostrictive materials, Anisotropy

PROCEEDINGS ARTICLE | July 11, 2002
Proc. SPIE. 4699, Smart Structures and Materials 2002: Active Materials: Behavior and Mechanics
KEYWORDS: Thin films, Sputter deposition, Annealing, Crystals, Copper, X-ray diffraction, Transmission electron microscopy, Crystallography, Shape memory alloys, Temperature metrology

PROCEEDINGS ARTICLE | July 11, 2001
Proc. SPIE. 4333, Smart Structures and Materials 2001: Active Materials: Behavior and Mechanics
KEYWORDS: Thin films, Titanium, Atrial fibrillation, Sputter deposition, Crystals, X-rays, X-ray diffraction, Transmission electron microscopy, Shape memory alloys, Temperature metrology

Showing 5 of 8 publications
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