Kenneth G. LeSueur
Electronics Engineer at US Army Redstone Technical Test Ctr
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | April 30, 2007
Proc. SPIE. 6544, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing XII
KEYWORDS: Infrared imaging, Optical components, Safety, Extremely high frequency, Sensors, Collimators, Frequency modulation, Projection systems, Fermium, Missiles

PROCEEDINGS ARTICLE | May 22, 2006
Proc. SPIE. 6228, Modeling and Simulation for Military Applications
KEYWORDS: Infrared imaging, Extremely high frequency, Data modeling, Sensors, Computer simulations, Frequency modulation, Projection systems, Fermium, Missiles, Iterated function systems

PROCEEDINGS ARTICLE | May 20, 2005
Proc. SPIE. 5785, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing X
KEYWORDS: Infrared imaging, Extremely high frequency, Data modeling, Sensors, Signal attenuation, Computer simulations, Frequency modulation, Projection systems, Fermium, Missiles

PROCEEDINGS ARTICLE | July 19, 1999
Proc. SPIE. 3697, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing IV
KEYWORDS: Nonuniformity corrections, Infrared imaging, Sensors, Calibration, Image processing, Composites, Distortion, Projection systems, Infrared radiation, Resistors

PROCEEDINGS ARTICLE | July 13, 1998
Proc. SPIE. 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
KEYWORDS: Actuators, Nondestructive evaluation, Computer simulations, Kinematics, Frequency modulation, Projection systems, Infrared radiation, Fermium, Servomechanisms, Missiles

PROCEEDINGS ARTICLE | July 13, 1998
Proc. SPIE. 3368, Technologies for Synthetic Environments: Hardware-in-the-Loop Testing III
KEYWORDS: Nonuniformity corrections, Infrared imaging, Sensors, Calibration, Image processing, Interfaces, Image sensors, Projection systems, Infrared radiation, Frame grabbers

Showing 5 of 7 publications
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