Kenzi Murakami
at Olympus Corp
SPIE Involvement:
Conference Program Committee | Author
Publications (1)

PROCEEDINGS ARTICLE | January 22, 2005
Proc. SPIE. 5721, MOEMS Display and Imaging Systems III
KEYWORDS: Microelectromechanical systems, Confocal microscopy, Microscopes, Mirrors, Electrodes, Scanners, Silicon, Reflectivity, Head, Objectives

Conference Committee Involvement (14)
Endoscopic Microscopy XIV
2 February 2019 | San Francisco, California, United States
Endoscopic Microscopy XIII
27 January 2018 | San Francisco, California, United States
Endoscopic Microscopy XII
29 January 2017 | San Francisco, California, United States
Endoscopic Microscopy XI
14 February 2016 | San Francisco, California, United States
Endoscopic Microscopy X
8 February 2015 | San Francisco, California, United States
Showing 5 of 14 published special sections
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