Dr. Keren J. Kanarik
Sr. Technical Director at Lam Research Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 21 March 2017 Paper
Andreas Fischer, Richard Janek, John Boniface, Thorsten Lill, K. Kanarik, Yang Pan, Vahid Vahedi, Richard Gottscho
Proceedings Volume 10149, 101490H (2017) https://doi.org/10.1117/12.2258129
KEYWORDS: Ellipsometry, Etching, Focus stacking software, Plasma, Tin, Hydrogen, Aluminum, Fluorine, Plasma treatment, Semiconducting wafers

Proceedings Article | 17 March 2015 Paper
Thorsten Lill, Samantha Tan, Keren Kanarik, Yoshie Kimura, Gowri Kamarthy, Meihua Shen, Vahid Vahedi, Jeffrey Marks, Richard Gottscho
Proceedings Volume 9428, 942809 (2015) https://doi.org/10.1117/12.2178326
KEYWORDS: Etching, Silicon, Optical lithography, Semiconducting wafers, Focus stacking software, Critical dimension metrology, Oxides, Reactive ion etching, Ions, Plasma

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