Dr. Kestutis Grigoras
Senior Scientist at VTT Technical Research Ctr of Finland Ltd
SPIE Involvement:
Publications (11)

Proceedings Article | 26 February 2020 Paper
Aapo Varpula, Kirsi Tappura, Jonna Tiira, Kestutis Grigoras, Kai Viherkanto, Jouni Ahopelto, Mika Prunnila
Proceedings Volume 11289, 112891O (2020) https://doi.org/10.1117/12.2542194
KEYWORDS: Thermoelectric materials, Bolometers, Absorption, Thermography, Sensors, Silicon, Infrared bolometers, Data modeling, Reflectors, Metals

Proceedings Article | 30 May 2017 Paper
Kestutis Grigoras, Leif Grönberg, Jouni Ahopelto, Mika Prunnila
Proceedings Volume 10246, 102460Z (2017) https://doi.org/10.1117/12.2266603
KEYWORDS: Electrochemical etching, Coating, Picosecond phenomena, Scanning electron microscopy, Resistance, Fabrication, Silicon, Electrodes, Capacitance, Atomic layer deposition, Capacitors

Proceedings Article | 30 May 2017 Paper
Aapo Varpula, Andrey Timofeev, Andrey Shchepetov, Kestutis Grigoras, Jouni Ahopelto, Mika Prunnila
Proceedings Volume 10246, 102460L (2017) https://doi.org/10.1117/12.2266554
KEYWORDS: Bolometers, Silicon, Long wavelength infrared, Thermoelectric materials, Sensors, Infrared bolometers, Infrared imaging, Thermography, Infrared radiation, Microopto electromechanical systems, Infrared detection, Imaging systems, Photodetectors, Infrared sensors

Proceedings Article | 25 October 2012 Paper
Ville Heikkinen, Anton Nolvi, Ivan Kassamakov, Kestutis Grigoras, Sami Franssila, Edward Hæggström
Proceedings Volume 8466, 84660R (2012) https://doi.org/10.1117/12.930080
KEYWORDS: Glasses, Silicon, Semiconducting wafers, Oxides, Microfluidics, Photoresist materials, Photomasks, Nondestructive evaluation, 3D metrology, Imaging devices

Proceedings Article | 15 February 2012 Paper
V. Heikkinen, K. Hanhijärvi, J. Aaltonen, K. Grigoras, I. Kassamakov, S. Franssila, E. Haeggström
Proceedings Volume 8250, 825008 (2012) https://doi.org/10.1117/12.906178
KEYWORDS: Bridges, Light emitting diodes, Light sources, Microelectromechanical systems, 3D metrology, Optical testing, Visible radiation, Silicon, Optical interferometry, Lamps

Showing 5 of 11 publications
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