Kevin G. Harding
President, CTO at Optical Metrology Solutions
SPIE Involvement:
Board of Directors | Education Committee | Executive Committee | Nominating Committee | Past Presidents | Strategic Planning Committee | Symposia Committee | Fellow status | Conference Program Committee | Conference Chair | Symposium Committee | Track Chair | Editor | Author | Instructor
Area of Expertise:
Optical Metrology , 3D Metrology , Interferometry , Holography
Profile Summary

Kevin Harding is a Principal Scientist at GE Research. At the R&D center he leads the activity in Optical Metrology and provides guidance to a wide range of optical technology projects, doing work for the many businesses of GE. Before joining GE, as Director of the Electro-Optics Lab at the Industrial Technology Institute for 14 years, Kevin built the electro-optics business doing over 200 projects and spinning off a number (6) of commercial products. Within the technical community for over 30 years, he developed and chaired new techical conferences and workshops including the industry recognized Optics and Lighting for Machine Vision which he taught for over 15 years. Kevin Harding is internationally recognized for his expertise in 3D measurement technology, and has been recognized for this work by many organizations including:
Society of Manufacturing Engineers Outstanding Young Engineer Award 1989
Engineering Society of Detroit Leadership Award 1990
Automated Imaging Association, Leadership Award, 1994
SME (Society of Manufacturing Engineers) Eli Whitney Productivity Award 1997
SPIE President's award 2010

Kevin. Harding has published over 120 technical papers, taught over 60 short courses and tutorials to industrial and academic audiences, as well as an NTU video course on Optical Metrology, contributed sections to 7 books, and received over 57 patents. He has served on industrial advisory committees, society Committee chair and conference chair for over 25 years working with the SPIE, LIA, ESD, SME, and OSA. Kevin was the Chair of the Machine Vision Association (1991), chair of the SME Publications Committee (1993-4) and 2008 President of SPIE-the International Society for Optics and Photinics as well as a fellow of the SPIE.
Publications (130)

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Phase shifts, Polarization, 3D metrology, Aerospace engineering, Metals, Structured light, Inspection, Spatial resolution, Additive manufacturing, Mirrors

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Reflection, Glasses, Metals, Structured light, Cameras, Interference (communication), Polarizers, Optical testing, High dynamic range imaging, Sensors

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Metals, Structured light, 3D metrology, Additive manufacturing, Process control, Machine vision, Optical metrology, Light sources and illumination, Light emitting diodes, Image filtering

PROCEEDINGS ARTICLE | May 14, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII
KEYWORDS: Cameras, Optical alignment, Printing, Additive manufacturing, Visualization, Calibration, Light sources and illumination, Error analysis, Optics manufacturing

PROCEEDINGS ARTICLE | May 10, 2018
Proc. SPIE. 10667, Dimensional Optical Metrology and Inspection for Practical Applications VII

Showing 5 of 130 publications
Conference Committee Involvement (40)
Applied Optical Metrology III
11 August 2019 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VIII
16 April 2019 | Baltimore, Maryland, United States
Dimensional Optical Metrology and Inspection for Practical Applications VII
18 April 2018 | Orlando, Florida, United States
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Dimensional Optical Metrology and Inspection for Practical Applications VI
13 April 2017 | Anaheim, California, United States
Showing 5 of 40 published special sections
Course Instructor
SC609: Basic Optics for Non-Optics Personnel
This course will provide the technical manager, sales engineering, marketing staff, or other non-optics personnel with a basic, non-mathematical introduction to the terms, specifications, and concepts used in optical technology to facilitate effective communication with optics professionals on a functional level. Topics to be covered include basic concepts such as imaging, interference, diffraction, polarization and aberrations, definitions relating to color and optical quality, and an overview of the basic measures of optical performance such as MTF and wavefront error. The material will be presented with a minimal amount of math, rather emphasizing working concepts, definitions, rules of thumb, and visual interpretation of specifications. Specific applications will include defining basic imaging needs such as magnification, depth-of-field, and MTF as well as the definitions of radiometric terms.
SC583: How to Use Machine Vision In Your Industrial Inspection Application
This course will provide the potential user, developer, or current practitioner with a broad understanding of the tools available for the application of machine vision and optical metrology methods as applied to industrial inspection and measurement needs. Material covered in this course will include the selection of optical components such as lenses, filters, cameras and light sources to achieve specific performance objectives. In addition, this course will review a wide range of standard and specialized methods of lighting, imaging and analyzing industrial parts using current off-the-shelf systems and software packages. Finally, this course will provide case study examples of successful applications and the steps needed to reach such success. Attendees are encouraged to bring their application problems for a hands-on workshop session with actual machine vision hardware and software at the end of the course.
SC1004: 3D Optical Metrology - Hands-on Workshop
The fast moving field of 3D measurement has seen an explosion of commercial systems that border on the capabilities of the "Star Trek" replicator. In this tutorial, the fast moving field of laser based gaging, 3-dimensional measurement, and automated 3-dimensional inspection technology will be presented within a framework of real-life applications to durable goods manufacturing. Examples of currently available systems and applications will be presented along with some of the history and future potential of these technologies. This tutorial will provide the attendee a background on the capabilities of industrial application of optical based measurement and monitoring technology. The technologies that will be discusses in this tutorial include: • moire contouring for tool and die applications • laser triangulation scanners for online measurements • 3D scanners for reverse engineering applications The lecture will be supplemented by a hands-on session using a variety of basic gaging tool and commercial systems. In this hands-on session, the attendees will be split into teams, each with a specific part and measurement task (choosen by the team from a set provided). Each team will evalute the technologies available, and report out to the group on their conclusions. Attendees are welcome to bring their own parts for an open forum discussion at the end of the course.
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