Prof. Kevin L. Lear
Professor at Colorado State Univ
SPIE Involvement:
Conference Program Committee | Author | Instructor
Publications (34)

Proceedings Article | 23 February 2011
Proc. SPIE. 7902, Imaging, Manipulation, and Analysis of Biomolecules, Cells, and Tissues IX
KEYWORDS: Refractive index, Fabry–Perot interferometers, Microfluidics, Electrodes, Glasses, Spectroscopy, Optical analysis, Dielectrophoresis, Refraction, Temperature metrology

Proceedings Article | 22 February 2011
Proc. SPIE. 7890, Advanced Biomedical and Clinical Diagnostic Systems IX
KEYWORDS: Refractive index, Mirrors, Microfluidics, Biomedical optics, Statistical analysis, Cancer, Blood, Spectroscopy, Diagnostics, Lymphoma

Proceedings Article | 9 February 2011
Proc. SPIE. 7941, Integrated Optics: Devices, Materials, and Technologies XV
KEYWORDS: Metrology, Microfluidics, Modulation, Waveguides, Cladding, Sensors, Biosensors, Computer simulations, Optical simulations, Beam propagation method

Proceedings Article | 26 February 2010
Proc. SPIE. 7598, Optical Components and Materials VII
KEYWORDS: Photodetectors, Waveguides, Cladding, Sensors, Metals, Silicon, Semiconductor lasers, CMOS technology, Optical interconnects, Absorption

Proceedings Article | 24 February 2010
Proc. SPIE. 7559, Optical Fibers and Sensors for Medical Diagnostics and Treatment Applications X
KEYWORDS: Photodetectors, Refractive index, Optical lithography, Modulation, Waveguides, Cladding, Sensors, Biosensors, Detector arrays, Beam propagation method

Showing 5 of 34 publications
Conference Committee Involvement (13)
Vertical-Cavity Surface-Emitting Lasers XIX
11 February 2015 | San Francisco, California, United States
Vertical-Cavity Surface-Emitting Lasers XVIII
6 February 2014 | San Francisco, California, United States
Vertical-Cavity Surface-Emitting Lasers XVII
6 February 2013 | San Francisco, California, United States
Vertical-Cavity Surface-Emitting Lasers XVI
25 January 2012 | San Francisco, California, United States
Vertical-Cavity Surface-Emitting Lasers XV
26 January 2011 | San Francisco, California, United States
Showing 5 of 13 Conference Committees
Course Instructor
SC053: Testing and Reliability of Semiconductor Lasers
This course covers device physics, testing, lifetime and reliability evaluations of semiconductor lasers. The features of semiconductor lasers that are relevant to the device performance and reliability are briefly reviewed. Various laser characterization methods are described. Techniques for evaluation of laser lifetime and factors affecting laser reliability are discussed. Recent developments in semiconductor lasers are presented in the context of their impact on testing and reliability.
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