Prof. Khaled J. Habib
S.Research Scientist at Kuwait Institute for Scientific Research
SPIE Involvement:
Fellow status | Conference Program Committee | Author
Area of Expertise:
Techniques of optical interferometry , Holographic interferometry , Shearography , Science & Technology of new instruments of electrochemistry , NDT methods of materials evaluation in corrosive media , Metallic Corrosion
Profile Summary

Dr. Khaled Habib holds a Ph.D in Chem. and Mats. Engr. from the Optical Science and Technological Center of University of Iowa, Iowa, USA, 1988. He was a Post-doctoral Fellow at the Chem. Engr. Dept., and Mat. sci. Dept., of the Technical University of Aachen, Aachen, Germany, 1991-1992. He specializes in “Quantum Electrochemistry” and more specifically “Opto-electrochemical instruments” in which solely light (as a quantum tool) can be used not only for submicroscopic imaging of surface/interface phenomena of solids in electrolytes, but also, it can be used in situ to measure electrochemical parameters corresponding to the surface/interface phenomena of the solids. Also, Materials Science, Metallic corrosion, and Characterization of nanometer structures of metallic glasses are of interest. Mr. Habib has in his credit more than 126 articles in international refereed journals in his area of specialization. He is a fellow of the SPIE (http://spie.org/x38.xml). Also, he is a member of the international Corrosion Council (ICC), (http://www.icc-net.org/ICCmembers_Kuwait.html). In addition, he is a Member of the editorial board of five Journals; the journal of Corrosion Science and Technology(j-cst.org/sub/committee.asp), the Journal of Environmental Science and Engineering A&B (http://www.davidpublishing.com/journals_info.asp?jId=1025),the American Journal of Applied Chemistry(http://www.sciencepublishinggroup.com/journal/peerreviewers.aspx?journalid=227), the journal of Science Research(http://www.sciencepublishinggroup.com/journal/editorialboard.aspx?journalid=181), the journal of Advances in Petroleum Exploration and Development(http://cscanada.net/index.php/aped/about/editorialTeam).
He has been a reviewer for a number of journals; Optics and Lasers in Engineering, Applied Optics, Optical Engineering, Optics and Lasers Technology, the Optical Expression, IEEE Transaction Instruments and Measurements, the ASTM journal of Testing and Evaluation,
Publications (47)

PROCEEDINGS ARTICLE | May 5, 2012
Proc. SPIE. 8430, Optical Micro- and Nanometrology IV
KEYWORDS: Carbon, Shearography, Optical coatings, Thin films, Temperature metrology, Gold, Polishing, Dielectric spectroscopy, Thin film coatings, Ultraviolet radiation

PROCEEDINGS ARTICLE | September 14, 2011
Proc. SPIE. 8133, Dimensional Optical Metrology and Inspection for Practical Applications
KEYWORDS: Carbon, Shearography, Optical coatings, Temperature metrology, Natural surfaces, Resistance, Dielectric spectroscopy, Electrodes, Cameras, Time metrology

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII
KEYWORDS: Carbon, Oxides, Holographic interferometry, Corrosion, Iron, Electromagnetism, Resistance, Optical interferometry, Mathematical modeling, Temperature metrology

PROCEEDINGS ARTICLE | May 11, 2011
Proc. SPIE. 8074, Holography: Advances and Modern Trends II
KEYWORDS: Carbon, Oxides, Holographic interferometry, Corrosion, Iron, Optical interferometry, Resistance, Electromagnetism, Mathematical modeling, Interferometry

PROCEEDINGS ARTICLE | August 3, 2010
Proc. SPIE. 7790, Interferometry XV: Techniques and Analysis
KEYWORDS: Carbon, Oxides, Holographic interferometry, Corrosion, Iron, Optical interferometry, Electromagnetism, Resistance, Mathematical modeling, Temperature metrology

PROCEEDINGS ARTICLE | May 20, 2010
Proc. SPIE. 7743, Southeast Asian International Advances in Micro/Nanotechnology
KEYWORDS: Oxides, Aluminum, Resistance, Capacitance, Mathematical modeling, Polarization, Oxygen, Dielectric spectroscopy, Particles, Electrodes

Showing 5 of 47 publications
Conference Committee Involvement (63)
Fifth International Conference on Sensors and Electronic Instrumentation Advances (SEIA' 2019),International Program Committee Member
25 September 2019 |
The 12th International Symposium on Photonics and Optoelectronics (SOPO 2019), a member of technical program committee
17 August 2019 |
The 12th International Symposium on Photonics and Optoelectronics (SOPO 2019), a member of Technical Program Committee(TPC)
17 August 2019 |
Applied Optical Metrology III
11 August 2019 | San Diego, California, United States
OSCINE NEST-Conference on Molecular Physics, A member of the international advisory committe
17 June 2019 |
Showing 5 of 63 published special sections
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