The Spectroscopy and Coherent Scattering (SCS) instrument of the European XFEL is a soft X-ray beamline aiming to unravel electronic, spin and structural properties of materials in ultrafast processes at the nanoscale. Various experimental techniques offered at SCS have different requirements in terms of beam size at the sample. Kirkpatrick-Baez (KB) refocusing optics equipped with mechanical benders allows for independent change of the horizontal and vertical beam size. We report here on the first characterization of the SCS KB mirrors by means of a novel diffraction-based technique which images the beam profile on a 2D pixelated detector. This approach provides a quick characterization of micrometer beam sizes. Results are compared with metrology measurements obtained with a non-contact slope profiler.