Kieran B. Wiseman
at Cranfield Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Optical encoders, Dimensional metrology, Laser applications, Interferometry, Motion measurement, Interferometers, Mirrors, Reflection, Sensors, Beam splitters

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