Dr. Kikuo Furukawa
at Mitsubishi Gas Chemical Co Inc
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 20 March 2015
Proc. SPIE. 9425, Advances in Patterning Materials and Processes XXXII
KEYWORDS: Lithography, Optical lithography, Polymers, Diffusion, Photoresist materials, Extreme ultraviolet, Extreme ultraviolet lithography, Line edge roughness, Photopolymers, Statistical modeling

Proceedings Article | 27 March 2014
Proc. SPIE. 9051, Advances in Patterning Materials and Processes XXXI
KEYWORDS: Lithography, Optical lithography, Polymers, Scanning electron microscopy, Photoresist materials, Extreme ultraviolet, Extreme ultraviolet lithography, Line edge roughness, Photoresist processing, Photoresist developing

Proceedings Article | 27 March 2014
Proc. SPIE. 9051, Advances in Patterning Materials and Processes XXXI
KEYWORDS: Lithography, Optical lithography, Polymethylmethacrylate, Polymers, Diffusion, Scanning electron microscopy, Extreme ultraviolet, Extreme ultraviolet lithography, Line edge roughness, Resolution enhancement technologies

Proceedings Article | 30 March 2010
Proc. SPIE. 7639, Advances in Resist Materials and Processing Technology XXVII
KEYWORDS: Lithography, Polymers, Diffusion, Quantum efficiency, Photoresist materials, Extreme ultraviolet, Extreme ultraviolet lithography, Line edge roughness, Photopolymers, Absorption

Proceedings Article | 1 April 2009
Proc. SPIE. 7273, Advances in Resist Materials and Processing Technology XXVI
KEYWORDS: Lithography, Polymethylmethacrylate, Polymers, Electrons, Diffusion, Oxygen, Extreme ultraviolet, Extreme ultraviolet lithography, Photopolymers, Statistical modeling

Showing 5 of 6 publications
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