Kirill S. Povarov
Student at ITMO University
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10329, Optical Measurement Systems for Industrial Inspection X
KEYWORDS: Photodetectors, Scattering, Sensors, Electrodes, Dielectrics, Silicon, Manufacturing, Power supplies, Computer programming, Optical testing, Data acquisition, Signal processing, Diodes, Motion measurement, Robotic systems, Optics manufacturing

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