Kirill V. Trifonov
at National Research Univ of ITMO
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 22 June 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Photodetectors, Optical amplifiers, Interferometers, Image processing, Video, Error analysis, Inspection, Chromium, Photodiodes, Optical testing

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