Kirsten L. Brookshire
at
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 7, 2013
Proc. SPIE. 8923, Micro/Nano Materials, Devices, and Systems
KEYWORDS: Thermography, Thin films, Calibration, Gallium arsenide, Silicon, Profilometers, Diodes, Plasma enhanced chemical vapor deposition, Cryogenics, Temperature metrology

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