Kisho Shibakiri
at Tokyo Institute of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 6 August 2014
Proc. SPIE. 9232, International Conference on Optical Particle Characterization (OPC 2014)
KEYWORDS: Refractive index, Contamination, Imaging systems, Scattering, Glasses, Particles, Light scattering, Digital cameras, Optical testing, Mie scattering

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