Klaus-Peter Proll
at Univ Stuttgart
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 10, 2004
Proc. SPIE. 5457, Optical Metrology in Production Engineering
KEYWORDS: Holography, Phase shift keying, Polarizers, Liquid crystal on silicon, LCDs, Liquid crystals, Transmittance, Binary data, Phase shifts, Amplitude modulation

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Light emitting diodes, Modulation, Cameras, Time metrology, Liquid crystal on silicon, LCDs, Objectives, Ronchi rulings, Liquid crystals, Digital micromirror devices

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