Dr. Klaus Oberhauser
at A3PICs Electronics Development GmbH
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Semiconductors, Photodetectors, Modulation, Sensors, Optical testing, Optoelectronics, Signal processing, Distance measurement, Photonic integrated circuits, Device simulation

PROCEEDINGS ARTICLE | June 18, 2007
Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V
KEYWORDS: Photodetectors, Modulation, Sensors, Receivers, Phase shift keying, Optoelectronics, Distance measurement, 3D metrology, Integrated optics, Photonic integrated circuits

PROCEEDINGS ARTICLE | October 15, 2005
Proc. SPIE. 5964, Detectors and Associated Signal Processing II
KEYWORDS: Modulation, Sensors, Receivers, Phase shift keying, Time metrology, Signal processing, Distance measurement, Photonic integrated circuits, Phase shifts, Correlation function

PROCEEDINGS ARTICLE | September 24, 2005
Proc. SPIE. 5954, Optical Security Systems
KEYWORDS: Mirrors, Optical amplifiers, Switching, Modulation, Signal attenuation, Photodiodes, Distance measurement, Integrated optics, Transistors, Correlation function

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