Dr. Klemen Zbontar
at LPKF Laser & Electronics doo
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | September 6, 2013
Proc. SPIE. 8839, Dimensional Optical Metrology and Inspection for Practical Applications II
KEYWORDS: Laser sources, Speckle, Scattering, Sensors, Ultraviolet radiation, Laser applications, Laser scattering, Translucency, Laser metrology, Scattering compensation

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