Koen De Munck
Project Leader at IMEC
SPIE Involvement:
Author
Publications (6)

PROCEEDINGS ARTICLE | September 25, 2017
Proc. SPIE. 10562, International Conference on Space Optics — ICSO 2016
KEYWORDS: CMOS sensors, Imaging systems, Image processing, Diffusion, Manufacturing, Capacitance, Image sensors, Astronomical imaging, Analog electronics, Camera shutters

PROCEEDINGS ARTICLE | October 3, 2011
Proc. SPIE. 8176, Sensors, Systems, and Next-Generation Satellites XV
KEYWORDS: Imaging systems, Sensors, Metals, Indium, Silicon, Quantum efficiency, Detector arrays, Aluminum, Modulation transfer functions, Semiconducting wafers

PROCEEDINGS ARTICLE | September 23, 2009
Proc. SPIE. 7474, Sensors, Systems, and Next-Generation Satellites XIII
KEYWORDS: Readout integrated circuits, Imaging systems, Sensors, Ultraviolet radiation, Silicon, Quantum efficiency, Detector arrays, Modulation transfer functions, Semiconducting wafers, Absorption

PROCEEDINGS ARTICLE | July 22, 2008
Proc. SPIE. 7021, High Energy, Optical, and Infrared Detectors for Astronomy III
KEYWORDS: Bolometers, Electronics, Sensors, Quantum efficiency, Black bodies, Monochromators, Signal detection, Camera shutters, Temperature metrology, Bandpass filters

PROCEEDINGS ARTICLE | September 12, 2007
Proc. SPIE. 6660, Infrared Systems and Photoelectronic Technology II
KEYWORDS: Infrared sensors, Capacitors, Sensors, Indium, Silicon, Amplifiers, Detector arrays, Infrared radiation, Semiconducting wafers, Cryogenics

PROCEEDINGS ARTICLE | September 8, 2004
Proc. SPIE. 5454, Micro-Optics: Fabrication, Packaging, and Integration
KEYWORDS: Staring arrays, Readout integrated circuits, Oxides, Sensors, Ultraviolet radiation, Indium, Silicon, Infrared radiation, Extreme ultraviolet, Semiconducting wafers

Showing 5 of 6 publications
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