Mr. Konstantin Ni. Galkin
Post-graduate Student at Institute for Automation and Control Processes
SPIE Involvement:
Author
Publications (5)

PROCEEDINGS ARTICLE | December 14, 2016
Proc. SPIE. 10176, Asia-Pacific Conference on Fundamental Problems of Opto- and Microelectronics
KEYWORDS: Magnesium, Optical properties, Optoelectronics

PROCEEDINGS ARTICLE | June 8, 2005
Proc. SPIE. 5851, Fundamental Problems of Optoelectronics and Microelectronics II
KEYWORDS: Mirrors, Optical properties, Crystals, X-ray diffraction, Silicon, Magnetism, Atomic force microscopy, Semiconducting wafers, Plasma, Absorption

PROCEEDINGS ARTICLE | June 8, 2005
Proc. SPIE. 5851, Fundamental Problems of Optoelectronics and Microelectronics II
KEYWORDS: Thin films, Magnesium, Reflection, Annealing, Crystals, Dielectrics, Electrons, Silicon, Silicon films, Absorption

PROCEEDINGS ARTICLE | June 8, 2005
Proc. SPIE. 5851, Fundamental Problems of Optoelectronics and Microelectronics II
KEYWORDS: Magnesium, Spectroscopy, Annealing, Crystals, Dielectrics, Electrons, Silicon, Reflectivity, Atomic force microscopy, Silicon films

PROCEEDINGS ARTICLE | June 17, 2003
Proc. SPIE. 5129, Fundamental Problems of Optoelectronics and Microelectronics
KEYWORDS: Semiconductors, Refractive index, Magnesium, Oscillators, Reflection, Dielectrics, Electrons, Silicon, Silicon films, Absorption

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