Dr. Konstantinos Falaggis
Assistant Professor at UNC Charlotte
SPIE Involvement:
Conference Program Committee | Author
Publications (16)

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Fringe analysis, Phase shifting, Deflectometry, 3D metrology, Modulation transfer functions, Phase measurement, Environmental sensing, Phase shifts

PROCEEDINGS ARTICLE | August 18, 2018
Proc. SPIE. 10749, Interferometry XIX
KEYWORDS: Metrology, Interferometers, Interferometry, Phase interferometry, Optical communications, Phase measurement

PROCEEDINGS ARTICLE | March 9, 2016
Proc. SPIE. 9718, Quantitative Phase Imaging II
KEYWORDS: Diffraction, Super resolution, Imaging systems, Microscopy, X-ray microscopy, Fourier transforms, Image resolution, Wavefronts, Phase retrieval, Phase imaging, Algorithm development, X-ray imaging, Radio propagation, Resolution enhancement technologies

PROCEEDINGS ARTICLE | August 24, 2015
Proc. SPIE. 9660, SPECKLE 2015: VI International Conference on Speckle Metrology
KEYWORDS: Signal to noise ratio, X-ray optics, Metrology, Spatial frequencies, Speckle, Phase retrieval, Reconstruction algorithms, Wavefront reconstruction, Contrast transfer function, Electroluminescent displays

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Modulation, Cameras, Sensors, Fourier transforms, Phase shift keying, Phase retrieval, Wave propagation, Pixel resolution, Spherical lenses, Radio propagation

PROCEEDINGS ARTICLE | August 18, 2014
Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis
KEYWORDS: Signal to noise ratio, Spatial frequencies, Cameras, Error analysis, Interferometry, Phase retrieval, Wave propagation, Reconstruction algorithms, Contrast transfer function, Light wave propagation

Showing 5 of 16 publications
Conference Committee Involvement (4)
Interferometry XIX
21 August 2018 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Optical Micro- and Nanometrology
5 April 2016 | Brussels, Belgium
Interferometry XVII: Advanced Applications
19 August 2014 | San Diego, California, United States
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