Prof. Kotoji Ando
at Yokohama National Univ
SPIE Involvement:
Conference Program Committee | Author
Publications (3)

PROCEEDINGS ARTICLE | February 16, 2004
Proc. SPIE. 5648, Smart Materials III
KEYWORDS: Polishing, Ceramics, Heat treatments, Scanning electron microscopy, Solids, Aluminum, Silicon carbide, Surface finishing, Temperature metrology, Oxidation

PROCEEDINGS ARTICLE | February 16, 2004
Proc. SPIE. 5648, Smart Materials III
KEYWORDS: Particles, Ceramics, Silicon, Scanning electron microscopy, Aluminum, Silicon carbide, Nanocomposites, Photomicroscopy, Failure analysis, Industrial chemicals

PROCEEDINGS ARTICLE | February 16, 2004
Proc. SPIE. 5648, Smart Materials III
KEYWORDS: Particles, Ceramics, Composites, Silicon, Reliability, Scanning electron microscopy, Silicon carbide, Carbon monoxide, Temperature metrology, Oxidation

Conference Committee Involvement (1)
Smart Materials III
13 December 2004 | Sydney, Australia
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