Dr. Kris Frutschy
at GE Global Research
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 19 March 2010
Proc. SPIE. 7622, Medical Imaging 2010: Physics of Medical Imaging
KEYWORDS: Electron beams, X-ray computed tomography, Fluctuations and noise, Sensors, X-rays, X-ray sources, Radiography, Control systems, X-ray imaging, Prototyping

Proceedings Article | 13 March 2009
Proc. SPIE. 7258, Medical Imaging 2009: Physics of Medical Imaging
KEYWORDS: Electron beams, X-ray computed tomography, Sensors, X-rays, X-ray sources, Control systems, Medical imaging, X-ray imaging, X-ray detectors, Temperature metrology

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