Dr. Kris Iniewski
at Redlen Technologies
SPIE Involvement:
Conference Program Committee | Author
Publications (7)

SPIE Journal Paper | 15 June 2020
JMI Vol. 7 Issue 03
KEYWORDS: Gadolinium, Sensors, Lutetium, Holmium, Computed tomography, Lanthanum, Lanthanides, X-ray computed tomography, X-rays, Optical computing

Proceedings Article | 14 May 2019
Proc. SPIE. 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV
KEYWORDS: Explosives detection, Sensors, Stereoscopy, Scanners, X-rays, X-ray diffraction, Image resolution, Tomography, Detector arrays, 3D image processing

Proceedings Article | 12 May 2016
Proc. SPIE. 9847, Anomaly Detection and Imaging with X-Rays (ADIX)
KEYWORDS: Coherence imaging, Photon counting, Imaging systems, Sensors, Spectroscopy, X-rays, Image resolution, Imaging spectroscopy, X-ray imaging, X-ray detectors

Proceedings Article | 2 September 2010
Proc. SPIE. 7805, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XII
KEYWORDS: Gold, Sensors, Polymers, Metals, Coating, Reliability, Resistance, Sensor performance, Photomasks, Epoxies

Proceedings Article | 17 September 2009
Proc. SPIE. 7449, Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XI
KEYWORDS: Semiconductors, Gold, Homeland security, Sensors, Electrodes, Metals, Electrons, Resistance, Image resolution, Medical imaging

Showing 5 of 7 publications
Conference Committee Involvement (4)
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics XXII
25 August 2020 | Online Only, California, United States
Anomaly Detection and Imaging with X-Rays (ADIX) III
17 April 2018 | Orlando, Florida, United States
Anomaly Detection and Imaging with X-Rays (ADIX) II
12 April 2017 | Anaheim, California, United States
Anomaly Detection and Imaging with X-Rays (ADIX)
19 April 2016 | Baltimore, Maryland, United States
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