Dr. Krishan Pal Chaudhary
at National Physical Lab
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 18 August 2005
Proc. SPIE. 5879, Recent Developments in Traceable Dimensional Measurements III
KEYWORDS: Imaging systems, Cameras, Image processing, Surface roughness, Image acquisition, Optical testing, CCD cameras, 3D metrology, Surface finishing, 3D image processing

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