Kristof Teelen
at Hogeschool Gent
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | January 17, 2005
Proc. SPIE. 5675, Vision Geometry XIII
KEYWORDS: Visual process modeling, Sensors, Matrices, Error analysis, Image registration, Optical inspection, Computer vision technology, Machine vision, Image classification, Affine motion model

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