Dr. Kristof Toth
at Yale Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 30 April 2023 Presentation
Gregory Doerk, Aaron Stein, Suwon Bae, Marcus Noack, Masafumi Fukuto, Ashish Kulkarni, Kristof Toth, Chinedum Osuji, Kevin Yager
Proceedings Volume PC12497, PC124970I (2023) https://doi.org/10.1117/12.2660507
KEYWORDS: Directed self assembly, Polymers, X-rays, X-ray microscopy, Scattering, Scanning electron microscopy, Resolution enhancement technologies, Nanostructures, Lithography, Grazing incidence

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