Mr. Krunoslav Romanjek
at ENSERG
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Oxides, Data modeling, Scattering, Germanium, Interfaces, Silicon, Control systems, Transistors, Field effect transistors, Gadolinium

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